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Journey to Data Quality

By Yang W. Lee, Leo L. Pipino, Richard Y. Wang, and James D. Funk
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Specifications

Paperback

  • Pages: 240p.
  • Illustrations: 41 illus.
  • Dimensions: 6 x 9 inches
  • Publication Date: August 21, 2009
  • Distributor: The MIT Press
  • ISBN: 9780262513357
  • ISBN10: 0262513358